Board Level Failure Mechanisms and Analysis in Hand-held Electronic Products
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[1] N. Sbar,et al. Bias-Humidity Performance of Encapsulated and Unencapsulated Ti-Pd-Au Thin-Film Conductors in an Environment Contaminated with Cl 2 , 1976 .
[2] G. T. Kohman,et al. Silver migration in electrical insulation , 1955 .
[3] A. Raffalovich. Corrosive Effects of Solder Flux on Printed-Circuit Boards , 1971 .
[4] T. W. Griswold,et al. Migratory Gold Resistive Shorts: Chemical Aspects of a Failure Mechanism , 1975, 13th International Reliability Physics Symposium.
[5] B. H. Nall,et al. Metal electromigration induced by solder flux residue in hybrid microcircuits , 1988, 38th Electronics Components Conference 1988., Proceedings..
[6] U. D. Perera,et al. Evaluation of reliability of BGA solder joints through twisting and bending 1 1 An earlier version , 1999 .
[7] Hee-Dong Yang,et al. Package to board interconnection shear strength (PBISS): effect of surface finish, PWB build-up layer and chip scale package structure , 2004 .
[8] S. Umemura,et al. Degradation Mechanisms in Tin- and Gold-Plated Connector Contacts , 1987 .
[9] Gábor Harsányi,et al. Electrochemical processes resulting in migrated short failures in microcircuits , 1995 .