论文信息 - Self-consistent integrated system for susceptibility to terrestrial neutron induced soft-error of sub-quarter micron memory devices

Self-consistent integrated system for susceptibility to terrestrial neutron induced soft-error of sub-quarter micron memory devices

Concerns about Single Event Upset (SEU) induced by terrestrial neutron at the ground are growing as scaling down of semiconductor device proceeds. A highly integrated procedure named SECIS (SElf-Consistent Integrated System for susceptibility to terrestrial neutron soft-error) is proposed to estimate soft-error rate (SER) at any place on the earth. A good agreement is obtained from SECIS within 35% error between the measured and estimated SERs in three locations in Japan.

Yasuo Yahagi | Takashi Nakamura | T. Nunomiya | Y. Saito | K. Terunuma

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