Online detection of defects in layered manufacturing
暂无分享,去创建一个
Mohsen A. Jafari | Izzat Bakhadyrov | Gülgün Alpan-Gaujal | Tong Fang | M. Jafari | Tong Fang | I. Bakhadyrov | Gülgün Alpan-Gaujal
[1] Kenneth W. Tobin,et al. Automatic classification of spatial signatures on semiconductor wafer maps , 1997, Advanced Lithography.
[2] Xue Yan,et al. PII: 0010-4485(95)00035-6 , 2003 .
[3] Gert Goch,et al. Nondestructive and contactless evaluation of surface coatings and adhesion defects by photothermal radiometry , 1996, Other Conferences.
[4] Kenneth W. Tobin,et al. Machine vision inspection of technical ceramics , 1996, Electronic Imaging.
[5] Gert Goch,et al. Photothermal inspection of material changes in ceramic surfaces induced by mechanical load or laser treatment , 1996, Other Conferences.