Motif analysis for automatic segmentation of CT surface contours into individual surface features
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[1] Y. H. Chen,et al. Quadric surface extraction using genetic algorithms , 1999, Comput. Aided Des..
[2] Michael Brady,et al. The Curvature Primal Sketch , 1986, IEEE Transactions on Pattern Analysis and Machine Intelligence.
[3] Paul Dierckx,et al. Curve and surface fitting with splines , 1994, Monographs on numerical analysis.
[4] Min Yang,et al. Segmentation of measured point data using a parametric quadric surface approximation , 1999, Comput. Aided Des..
[5] Ernesto Bribiesca,et al. How to describe pure form and how to measure differences in shapes using shape numbers , 1980, Pattern Recognit..
[6] Esther M. Arkin,et al. An efficiently computable metric for comparing polygonal shapes , 1991, SODA '90.
[7] M. S. Shunmugam. Comparison of motif combination with mean line and envelope systems used for surface profile analysis , 1987 .
[8] Ernesto Bribiesca,et al. A new chain code , 1999, Pattern Recognit..
[9] David J. Whitehouse,et al. Handbook of Surface Metrology , 2023 .
[10] C. F. Fahl. Motif combination — a new approach to surface profile analysis , 1982 .
[11] Colin Bradley,et al. Segmentation of a wrap-around model using an active contour , 1997, Comput. Aided Des..
[12] S. Liu,et al. Seed-growing segmentation of 3-D surfaces from CT-contour data , 1999, Comput. Aided Des..
[13] Sven Loncaric,et al. A survey of shape analysis techniques , 1998, Pattern Recognit..
[14] Ernesto Bribiesca,et al. A Geometric structure for two-dimensional shapes and three-dimensional surfaces , 1992, Pattern Recognit..
[15] Jacques Boulanger,et al. The “Motifs” method: An interesting complement to ISO parameters for some functional problems , 1992 .
[16] Andrew Y. C. Nee,et al. Geometric Feature Detection for Reverse Engineering Using Range Imaging , 1996, J. Vis. Commun. Image Represent..
[17] Yonghua Chen,et al. Robust segmentation of CMM data based on NURBS , 1997 .
[18] Ing.M. Dietzsch,et al. “The MOTIF-method (ISO 12085) — a suitable description for functional, manufactural and metrological requirements” , 1998 .