Structural, optical and electrical properties of SnxSy thin films grown by spray ultrasonic

Tin sulfide(Sn x S y ) thin films were prepared by a spray ultrasonic technique on glass substrate at 300℃. The influence of deposition time t =2, 4, 6, 8 and 10 min on different properties of thin films, such as(XRD), photoluminescence(PL) and(UV) spectroscopy visible spectrum and four-point were investigated. X-ray diffraction showed that thin films crystallized in SnS 2 , SnS, and Sn 2 S 3 phases, but the most prominent one is SnS 2 . The results of the(UV) spectroscopy visible spectrum show that the film which was deposited at 4 min has a large transmittance of 60% in the visible region. The photoluminescence spectra exhibited the luminescent peaks in the visible region, which shows its potential application in photovoltaic devices. The electrical resistivity( ρ ) values of Sn x S y films have changed from 8.1×10 -4 to 1.62Ω·cm with deposition time.

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