论文信息 - CROSS-CORRELATION BETWEEN IDD AND VOUT SIGNALS FOR TESTING ANALOGUE CIRCUITS

CROSS-CORRELATION BETWEEN IDD AND VOUT SIGNALS FOR TESTING ANALOGUE CIRCUITS

The cross-correlation between iDD and vout signals is addressed as a means for improving the testing of analogue circuits. Besides the higher testing confidence provided by mixed iDD/vout monitoring, a single unified test operation is performed instead of two separate operations.

I. M. Bell | J. Machado da Silva | J. Silva Matos | G. E. Taylor

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