Mixed signal test considerations for switched current signal processing
暂无分享,去创建一个
[1] Thomas W. Williams,et al. Design for testability of mixed signal integrated circuits , 1988, International Test Conference 1988 Proceeding@m_New Frontiers in Testing.
[2] John B. Hughes,et al. Switched currents-a new technique for analog sampled-data signal processing , 1989, IEEE International Symposium on Circuits and Systems,.
[3] A. Rubio,et al. Selftesting CMOS operational amplifier , 1992 .
[4] D. M. Wu. Can IDDQ test replace conventional stuck-fault test? , 1991, Proceedings of the IEEE 1991 Custom Integrated Circuits Conference.
[5] Yannis Tsividis,et al. Current copier cells , 1988 .
[6] Wojciech Maly,et al. Test generation for current testing (CMOS ICs) , 1990, IEEE Design & Test of Computers.
[7] Wojciech Maly,et al. Test generation for current testing , 1989, [1989] Proceedings of the 1st European Test Conference.
[8] Chin-Long Wey. Built-in self-test (BIST) structure for analog circuit fault diagnosis , 1990 .
[9] W. Groeneveld,et al. A self calibration technique for monolithic high-resolution D/A converters , 1989, IEEE International Solid-State Circuits Conference, 1989 ISSCC. Digest of Technical Papers.
[10] B. R. Bannister,et al. Supply current testing of mixed analogue and digital ICs , 1991 .
[11] Eric A. Vittoz,et al. Very accurate dynamic current mirrors , 1989 .
[12] Mani Soma. A design-for-test methodology for active analog filters , 1990, Proceedings. International Test Conference 1990.