Validating MODIS surface reflectance based on field spectral measurements
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Jianhua Mao | Qihong Zeng | Xuefeng Liu | Chunlei Guan | Xianhua Li | Qiang Chen | Jianhua Mao | Xuefeng Liu | Qihong Zeng | Xianhua Li | Qiang Chen | Chunlei Guan
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