Thickness dependence of parallel and perpendicular anisotropic resistivity in Ta/NiFe/IrMn/Ta multilayer studied by anisotropic magnetoresistance and planar Hall effect
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Kyung-Ho Shin | CheolGi Kim | N. D. Ha | L. T. Tu | Cheolgi Kim | N. T. Thanh | Chong‐Oh Kim | K. Shin | Nguyen Trung Thanh | Chong Oh Kim | B. Parvatheeswara Rao | N. Ha | B. Rao | L. Tu
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