论文信息 - Characterization of bulk damage in CMOS MAPS with deep N-well collecting electrode - 字舞流文

Characterization of bulk damage in CMOS MAPS with deep N-well collecting electrode

L. Ratti | G. Traversi | V. Cindro | S. Zucca | L. Bosisio | F. Morsani | S. Bettarini | G. Rizzo | I. Rashevskaya