Scaling of equivalent oxide thickness of atomic layer deposited HfO2 film using RuO2 electrodes suppressing the dielectric dead-layer effect
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Jae Ho Lee | Cheol Seong Hwang | Tae Joo Park | C. Hwang | Jae Ho Lee | T. Park | Hyo Kyeom Kim | Il-Hyuk Yu | I. Yu
[1] C. Hwang,et al. Gate Engineering in TiN/La/TiN and TiLaN Metal Layers on Atomic-Layer-Deposited $\hbox{HfO}_{2}/\hbox{Si}$ , 2012, IEEE Electron Device Letters.
[2] J. Robertson. High dielectric constant gate oxides for metal oxide Si transistors , 2006 .
[3] Sang Woon Lee,et al. Capacitors with an Equivalent Oxide Thickness of <0.5 nm for Nanoscale Electronic Semiconductor Memory , 2010 .
[4] G. Park,et al. Calculation of the intrinsic dead layers thicknesses from Au/Ba0.5Sr0.5TiO3/Pt thin film capacitors , 2006 .
[5] K. Ahmed,et al. Characterization of ultra-thin oxides using electrical C-V and I-V measurements , 1998 .
[6] S. Ferrari,et al. Ru and RuO2 gate electrodes for advanced CMOS technology , 2004 .
[7] H. Over,et al. Oxidation reactions over RuO2: A comparative study of the reactivity of the (110) single crystal and polycrystalline surfaces , 2001 .
[8] C. Hwang,et al. A COMPARATIVE STUDY ON THE ELECTRICAL CONDUCTION MECHANISMS OF (BA0.5SR0.5)TIO3 THIN FILMS ON PT AND IRO2 ELECTRODES , 1998 .
[9] John Robertson,et al. Fermi level pinning by defects in HfO2-metal gate stacks , 2007 .
[10] O. Vendik,et al. Dead layer characteristics based on a correlation of the ferroelectric polarization under relevant boundary conditions in a parallel plate capacitor , 2009 .
[11] T. Schram,et al. Flatband voltage shift of ruthenium gated stacks and its link with the formation of a thin ruthenium oxide layer at the ruthenium/dielectric interface , 2007 .
[12] Nicola A. Spaldin,et al. Origin of the dielectric dead layer in nanoscale capacitors , 2006, Nature.
[13] A. Tagantsev,et al. Ionic polarizability of conductive metal oxides and critical thickness for ferroelectricity in BaTiO3. , 2006, Physical review letters.
[14] M. Izuha,et al. Electrical Properties of All-Perovskite Oxide (SrRuO3/BaxSr1-xTiO3/SrRuO3) Capacitors , 1997 .
[15] C. Hwang. Thickness-dependent dielectric constants of (Ba,Sr)TiO3 thin films with Pt or conducting oxide electrodes , 2002 .
[16] First-principles calculation of capacitance including interfacial effects , 2008 .
[17] R. Dittmann,et al. Thickness dependence of intrinsic dielectric response and apparent interfacial capacitance in ferroelectric thin films , 2007 .
[18] J. Welser,et al. Electric-field penetration into metals: consequences for high-dielectric-constant capacitors , 1999 .
[19] Chang Seo Park,et al. Origin of the Flatband-Voltage Roll-Off Phenomenon in Metal/High- $k$ Gate Stacks , 2010, IEEE Transactions on Electron Devices.
[20] R. Wallace,et al. High-κ gate dielectrics: Current status and materials properties considerations , 2001 .
[21] K. Rabe. New life for the 'dead layer' , 2006 .