论文信息 - High-Temperature Thermoelectric Characterization of III–V Semiconductor Thin Films by Oxide Bonding - 字舞流文

High-Temperature Thermoelectric Characterization of III–V Semiconductor Thin Films by Oxide Bonding

J. Bowers | A. Gossard | A. Ramu | P. Burke | Hong Lu | J. Bahk | Z. Bian | A. Shakouri | J. Zide | D. Liang | G. Zeng | R. Singh