Test Method for AIC based on extension IEEE Std. 1241 Sine-wave Fit using Multi-Sine Signals

Analog-to-information converters (AIC) are devices that implement the compressive sensing theory, and are applied on sparse signals. There are some AIC architectures and several implementations have been already developed. However, few methods to test these devices have been proposed. In this paper, an adaptation of the extension IEEE Std. 1241 Sine-wave Fit using multi-sine signals is proposed for AIC testing. The main aim of the proposed test is to extract the Signal-to-Noise and Distortion Ratio (SINAD) from an implemented AIC directly from its measurements using multi-sine signals without requiring signal reconstruction. The implemented AIC was a configurable one based on the Random Modulation Pre-Integrator (RMPI) architecture. The obtained results validate the proposed test by comparing them to the SINAD and the Mean Square Error (MSE) values of the reconstructed signal, and also confirms that the performance of the AIC is directly proportional to the sparsity of the input signal, since the SINAD drops with the increase of the number of spectral components of the input signals, i.e with the decrease of sparsity.