Non-intrusive testing methodology for CMOS RF LNAs

This paper proposes a non-intrusive testing methodology for CMOS RF LNAs using the gain of the LNA as a test response to examine the effects of a particular set of spot defects. The impact of four types of resistive bridging faults is analyzed on a practical LNA example. A performance threshold for each fault location is established. Initial results show not only that the use of an ADC is possible, but also that it is a highly accurate device for testing CMOS LNAs. A discussion about both the strengths and limitations of this approach is also included.

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