CRIS: A test cultivation program for sequential VLSI circuits

An approach to cultivating a test for combinational and sequential VLSI circuits described hierarchically at the transistor, gate, and higher levels is discussed. The approach is based on continuous mutation of a given input sequence and on analyzing the mutated vectors for selecting the test set. The approach uses a hierarchical simulation technique in the analysis to drastically reduce the memory requirement, thus allowing the test generation for large VLSI circuits. The algorithms are at the switch level so that general MOS digital designs can be handled, and both stuck-at and transistor faults are handled accurately. The approach was implemented in a hierarchical test generation system, CRIS, that runs under UNIX on SPARC workstations. CRIS was used successfully to generate tests with high fault coverage for large combinational and sequential circuits.<<ETX>>