Impact of the switching activity on the aging of delay-PUFs

Physically Unclonable Functions (PUFs) are mainly used for generating unique keys to identify electronic devices. The reliability of PUFs needs to be assured under a wide variety of environmental conditions and aging mechanisms. In this paper, we evaluate the impact of NBTI and HCI aging on two types of delay-PUFs (arbiter-PUFs and loop-PUFs). The results show that the switching activity has a limited impact on delay chains and a significant impact on the arbiter (RS latch) of the arbiter-PUF.

[1]  Mehdi Baradaran Tahoori,et al.  ExtraTime: Modeling and analysis of wearout due to transistor aging at microarchitecture-level , 2012, IEEE/IFIP International Conference on Dependable Systems and Networks (DSN 2012).

[2]  Sylvain Guilley,et al.  Predictive Aging of Reliability of Two Delay PUFs , 2016, SPACE.

[3]  Mark Mohammad Tehranipoor,et al.  ARO-PUF: An aging-resistant ring oscillator PUF design , 2014, 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE).