Near-field photocurrent spectroscopy of laser diode devices

[1]  Pierre Petroff,et al.  Near-field scanning optical microscopy of cleaved vertical-cavity surface-emitting lasers , 1998 .

[2]  J. Tomm,et al.  Waveguide effect on the image formation process in near-field photocurrent spectroscopy of semiconductor laser diodes , 1997 .

[3]  Jens W. Tomm,et al.  Near-field photocurrent spectroscopy: A novel technique for studying defects and aging in high-power semiconductor lasers , 1997 .

[4]  T. Elsaesser,et al.  Selective excitation of packaging-induced defects in high-power diode laser arrays , 2000, CLEO 2000.

[5]  C. C. Bahr,et al.  Near-field photoconductivity: Application to carrier transport in InGaAsP quantum well lasers , 1994 .

[6]  Chi-Yu Liu,et al.  Near-field optical characterization of visible multiple quantum well semiconductor lasers , 1998, Photonics West.

[7]  Karl Joachim Ebeling,et al.  Spectrally resolved near‐field mode imaging of vertical cavity semiconductor lasers , 1996 .

[8]  T. Elsaesser,et al.  Monitoring of aging properties of AlGaAs high-power laser arrays , 1997 .

[9]  T. Elsaesser,et al.  Aging properties of high power laser diode arrays analyzed by Fourier-transform photocurrent measurements , 1997 .

[10]  B. Goldberg,et al.  NEAR-FIELD OPTICAL BEAM INDUCED CURRENT MEASUREMENTS ON HETEROSTRUCTURES , 1995 .

[11]  Bennett B. Goldberg,et al.  Beam divergence and waist measurements of laser diodes by near-field scanning optical microscopy , 1997 .

[12]  Gerhard Abstreiter,et al.  Optical photodetector for near‐field optics , 1994 .

[13]  Elias Towe,et al.  Near-field optical studies of semiconductor heterostructures and laser diodes , 1995 .

[14]  B. Goldberg,et al.  Pump intensity profiling of vertical-cavity surface-emitting lasers using near-field scanning optical microscopy , 1998 .

[15]  E. Fitzgerald,et al.  Near‐field scanning optical microscopy imaging of individual threading dislocations on relaxed GexSi1−x films , 1994 .

[16]  J. Jimenez.  Low-temperature spatially resolved photoconductivity in semi-insulating GaAs , 1992 .

[17]  Jens W. Tomm,et al.  Optical near-field photocurrent spectroscopy: A new technique for analyzing microscopic aging processes in optoelectronic devices , 1996 .

[18]  Thomas Elsaesser,et al.  Near-field optical-beam-induced current spectroscopy as a tool for analyzing aging processes in diode lasers , 1997, Photonics West.