Excess noise in vanadium tungsten oxide bolometric material
暂无分享,去创建一个
[1] R. N. Tait,et al. Noise behavior of amorphous GexSi1−xOy for microbolometer applications , 2005 .
[2] R. A. Wood,et al. Uncooled thermal imaging with monolithic silicon focal planes , 1993, Optics & Photonics.
[3] Lode K. J. Vandamme,et al. Noise as a diagnostic tool for quality and reliability of electronic devices , 1994 .
[4] Mahmoud Almasri,et al. Self-supporting uncooled infrared microbolometers with low-thermal mass , 2001 .
[5] X. Yi,et al. Linear uncooled microbolometer array based on VOx thin films , 2001 .
[6] F. Hooge. 1/f noise sources , 1994 .
[7] Y. Watabe,et al. A high performance amorphous Si/sub 1-x/C/sub x/:H thermistor bolometer based on micro-machined structure , 1997, Proceedings of International Solid State Sensors and Actuators Conference (Transducers '97).
[8] Hyun-Joon Shin,et al. Fabrication and characterization of bolometric oxide thin film based on vanadium-tungsten alloy , 2005 .
[9] J. Piotrowski,et al. Micromachined silicon bolometers as detectors of soft X-ray, ultraviolet, visible and infrared radiation , 1997 .
[10] Olaf Reinhold,et al. Growth and properties of semiconductor bolometers for infrared detection , 1995, Optics & Photonics.
[11] S. Ogale,et al. Evaluation of manganite films on silicon for uncooled bolometric applications , 2004 .
[12] L.K.J. Vandamme,et al. Experimental studies on 1/f noise , 1981 .