Evolvable hardware solutions for extreme temperature electronics

Temperature and radiation tolerant electronics, as well as long life survivability are key capabilities required for future NASA missions. Current approaches to electronics for extreme environments focus on component level robustness and hardening. Compensation techniques such as bias cancellation circuitry have also been employed. However, current technology can only ensure very limited lifetime in extreme environments. This paper presents a novel approach, based on evolvable hardware technology, which allows adaptive in-situ circuit redesign/reconfiguration during operation in extreme environments. This technology would complement material/device advancements and increase the mission capability to survive harsh environments. The approach is demonstrated on a prototype chip, which recovers functionality at 250/spl deg/C. Besides the applications that provide adaptive reconfiguration, evolutionary algorithms can be used to automatically design (fixed) circuits for high temperatures. While simulations show that conventional AND gate design fails at high temperatures such as 320/spl deg/C, evolution is able to synthesize AND gate circuits operating accurately at this temperature.

[1]  F. Shoucair.  Design Consideration in High Temperature Analog CMOS Integrated Circuits , 1986 .

[2]  F. Trofimenkoff,et al.  High temperature electronics using silicon technology , 1996, 1996 IEEE International Solid-State Circuits Conference. Digest of TEchnical Papers, ISSCC.

[3]  Fong Shi.  Analyzing bias cancellation techniques for high temperature analog applications , 1998, 1998 Fourth International High Temperature Electronics Conference. HITEC (Cat. No.98EX145).

[4]  Vu Duong,et al.  Evolution of analog circuits on field programmable transistor arrays , 2000, Proceedings. The Second NASA/DoD Workshop on Evolvable Hardware.

[5]  Gerhard Klimeck,et al.  EHWPack: a parallel Software/Hardware Environment for Evolvable Hardware , 2000, GECCO.

[6]  W. Wondrak.  Physical limits and lifetime limitations of semiconductor devices at high temperatures , 1999 .

[7]  Adrian Stoica,et al.  Reconfigurable VLSI architectures for evolvable hardware: from experimental field programmable transistor arrays to evolution-oriented chips , 2001, IEEE Trans. Very Large Scale Integr. Syst..

[8]  Paul J. Layzell,et al.  Evolution of Robustness in an Electronics Design , 2000, ICES.

[9]  Adrian Stoica,et al.  Toward evolvable hardware chips: Experiments with a programmable transistor array , 1999, Proceedings of the Seventh International Conference on Microelectronics for Neural, Fuzzy and Bio-Inspired Systems.

[10]  K. Mizuno,et al.  Analog CMOS integrated circuits for high-temperature operation with leakage current compensation , 1998, 1998 Fourth International High Temperature Electronics Conference. HITEC (Cat. No.98EX145).

[11]  Adrian Stoica,et al.  Fault-tolerant evolvable hardware using field-programmable transistor arrays , 2000, IEEE Trans. Reliab..