Built-in dynamic current sensor for hard-to-detect faults in mixed-signal ICs

There are some types of faults in analogue and mixed signal circuits which are very difficult to detect using either voltage or current based test methods. However, it is possible to detect these faults if we add to the conventional dynamic power supply current test methods I/sub DDT/, the analysis of the changes in the slope of this dynamic power supply current. In this work, we present a Built-In Current Sensor (BICS) which is able to process the highest frequency components in the dynamic power supply current of the circuit under test (CUT). The BICS adds to the resistive sensor an inductance made from a gyrator and a capacitor to carry out the current to voltage conversion. Moreover, the proposed test method improves the fault coverage in continuous circuits and switched current circuits as well.

[1]  Salvador Bracho,et al.  Dynamic Idd test circuit for mixed signal ICs , 1994 .

[2]  Antonio Rubio,et al.  A detailed analysis of GOS defects in MOS transistors: testing implications at circuit level , 1995, Proceedings of 1995 IEEE International Test Conference (ITC).

[3]  Jochen A. G. Jess,et al.  Probability analysis for CMOS floating gate faults , 1994, Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC.

[4]  Jean Paul Dom,et al.  On Chip IDDX Sensor , 1996 .

[5]  Viera Stopjaková,et al.  On-chip transient current monitor for testing of low-voltage CMOS IC , 1999, DATE '99.

[6]  Antonio Rubio,et al.  Electrical model of the floating gate defect in CMOS ICs: implications on IDDQ testing , 1994, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[7]  Linda S. Milor,et al.  Detection of catastrophic faults in analog integrated circuits , 1989, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[8]  Carlos Delgado Kloos,et al.  Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition , 2002, Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition.

[9]  M. Margala,et al.  1.5 volts Iddq/Iddt current monitor , 1999, Engineering Solutions for the Next Millennium. 1999 IEEE Canadian Conference on Electrical and Computer Engineering (Cat. No.99TH8411).

[10]  José Luis Huertas,et al.  Analog and mixed-signal benchmark circuits-first release , 1997, Proceedings International Test Conference 1997.

[11]  Franco Giannini,et al.  High-Q gyrator-based monolithic active tunable bandstop filter , 1998 .

[12]  Karim Arabi,et al.  Design and realization of an accurate built-in current sensor for on-line power dissipation measurement and I/sub DDQ/ testing , 1997, Proceedings International Test Conference 1997.

[13]  Miquel Roca,et al.  Experimental analysis of transient current testing based on charge observation , 1999 .