CRITICAL MODEL COMPONENTS AND THEIR FINGERPRINT FEATURES IN THE SIMULATED CONDUCTED RADIO FREQUENCY IMMUNITY OF COMPLEX INTEGRATED CIRCUITS

To analyze and to handle the radio frequency immunity of microcontrollers requires understanding the origins of the complex frequency response of the immunity. This paper assumes that the frequency response of the immunity can be characterized with a set of flngerprint features in the immunity curves. Positions and shapes of those flngerprint features are determined by certain components in the disturbance propagation network. In order to prove that assumption, a series of models are created and simulated. The roles of various model components on the immunity are analyzed by comparing the simulation results from difierent model structures. The flngerprint features on the immunity curves are identifled. The paper shows how to treat a wide-range immunity curve with separated features. It also shows the responsible model components for those separated features. With the awareness of those features and their origins, researchers can concentrate on extracting the models of the most important components in the disturbance propagation network when modeling the immunity of the complex integrated circuits like microcontrollers.