Valence band offset of ZnO/4H-SiC heterojunction measured by x-ray photoelectron spectroscopy
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Z. G. Wang | S. Y. Yang | Xuchun Liu | Riqing Zhang | Q. S. Zhu | G. Sun | P. F. Zhang | H. Fan | C. Jiao | H. Wei | Yu Chen | Q. Zhu | Z. Wang | S. Yang