论文信息 - Interfacial and Electrical Characterization of HfO2-Gated MOSCs and MOSFETs by C-V and Gated-Diode Method - 字舞流文

Interfacial and Electrical Characterization of HfO2-Gated MOSCs and MOSFETs by C-V and Gated-Diode Method

H. W. Chen | C. H. Chen | Chuan-Hsi Liu | H. L. Hwang | S. Y. Chen | F. C. Chiu | Z. Y. Hsieh | H. S. Huang