Heavy ion test results for the 68020 microprocessor and the 68882 coprocessor

The authors present a set of techniques allowing them to perform heavy ion testing on 32-bit microprocessors. They study particularly how the program executed by the circuit during the irradiation can modify the calculated upset cross-section. The approach is illustrated by experimental results obtained on both the Motorola 68020 microprocessor and its coprocessor 68882, by means of particle accelerators as well as Cf/sup 252/ fission-decay source equipment.<<ETX>>