Defect detection and property evaluation of indium tin oxide conducting glass using optical coherence tomography.
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Meng-Tsan Tsai | Feng-Yu Chang | Cheng-Kuang Lee | Ya-Ju Lee | Jiann-Der Lee | Hsiang-Chen Wang | Jiann-Der Lee | Ya-Ju Lee | F. Chang | Cheng-Kuang Lee | Hsiang-Chen Wang | M. Tsai
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