On utilization of BRAM in FPGA for advanced measurements in mechatronics
暂无分享,去创建一个
[1] Peter Y. K. Cheung,et al. Modelling degradation in FPGA lookup tables , 2009, 2009 International Conference on Field-Programmable Technology.
[2] Petr Pfeifer,et al. On measurement of impact of the metallization and FPGA design to the changes of slice parameters and generation of delay faults , 2012, 22nd International Conference on Field Programmable Logic and Applications (FPL).
[3] Peter Y. K. Cheung,et al. Improving FPGA Reliability with Wear-Levelling , 2011, 2011 21st International Conference on Field Programmable Logic and Applications.
[4] P. Pfeifer,et al. Delay-fault run-time XOR-less aging detection unit using BRAM in modern FPGAs , 2012, 2012 13th Biennial Baltic Electronics Conference.
[5] Robert H. Bishop,et al. The mechatronics handbook , 2002 .
[6] C.E. Shannon,et al. Communication in the Presence of Noise , 1949, Proceedings of the IRE.
[7] Petr Pfeifer,et al. A new method for in situ measurement of parameters and degradation processes in modern nanoscale programmable devices , 2014, Microprocess. Microsystems.
[8] Peter Y. K. Cheung,et al. Degradation Analysis and Mitigation in FPGAs , 2010, 2010 International Conference on Field Programmable Logic and Applications.
[9] Peter Y. K. Cheung,et al. Degradation in FPGAs: measurement and modelling , 2010, FPGA '10.
[10] Dilip V. Sarwate,et al. The frequency spectrum of pulse width modulated signals , 2003, Signal Process..
[11] Petr Pfeifer,et al. On measurement of parameters of programmable microelectronic nanostructures under accelerating extreme conditions (Xilinx 28nm XC7Z020 Zynq FPGA) , 2013, 2013 23rd International Conference on Field programmable Logic and Applications.