A Behavioral Model of a Built-in Current Sensor for IDDQ Testing

[1]  D. M. H. Walker,et al.  IDDX-based test methods: A survey , 2004, TODE.

[2]  Behzad Razavi,et al.  A study of oscillator jitter due to supply and substrate noise , 1999 .

[3]  D.M.H. Walker.  Requirements for practical I/sub DDQ/ testing of deep submicron circuits , 2000, Proceedings 2000 IEEE International Workshop on Defect Based Testing (Cat. No.PR00637).

[4]  Kwyro Lee,et al.  Charge recycling differential logic (CRDL) for low power application , 1996 .

[5]  Bin Xue,et al.  Technology scaling issues of an iddq built-in current sensor , 2005, Proceedings. 2005 IEEE International Workshop on Current and Defect Based Testing, 2005. DBT 2005..

[6]  Mark C. Johnson,et al.  Estimation of standby leakage power in CMOS circuits considering accurate modeling of transistor stacks , 1998, ISLPED '98.

[7]  D. M. H. Walker,et al.  A practical built-in current sensor for I/sub DDQ/ testing , 2001, Proceedings International Test Conference 2001 (Cat. No.01CH37260).

[8]  S. Middelhoek,et al.  Flip-flop sensors: a new class of silicon sensors☆ , 1986 .

[9]  David A. Johns,et al.  Analog Integrated Circuit Design , 1996 .

[10]  Y. Akazawa,et al.  Jitter analysis of high-speed sampling systems , 1990 .

[11]  Bin Xue,et al.  Voltage sensing based built-in current sensor for iddq test , 2005 .

[12]  Behzad Razavi,et al.  Design of Analog CMOS Integrated Circuits , 1999 .

[13]  D. M. H. Walker,et al.  I/sub DDQ/ test using built-in current sensing of supply line voltage drop , 2005, IEEE International Conference on Test, 2005..

[14]  J.-Y. Lin,et al.  Performance limitations of stochastic sensors , 1992, [1992] Proceedings of the 35th Midwest Symposium on Circuits and Systems.

[15]  Timothy R. Henry,et al.  Burn-in elimination of a high volume microprocessor using I/sub DDQ/ , 1996, Proceedings International Test Conference 1996. Test and Design Validity.