Latest measurement techniques at NPL for the characterization of infrared detectors and materials

In its role as the national standards laboratory for the UK, the National Physical Laboratory (NPL) maintains, develops and disseminates, amongst others, the UK's detector spectral responsivity scale and material spectrometric scales (regular, hemispherical and angular reflectance and transmittance). In order to carry this work out detectors, materials, methods and facilities are continually under development at NPL. This paper will present the latest measurement techniques used at NPL that are applicable for the characterisation of infrared detectors and materials. NPL has extensive calibration capabilities, making use of grating and FT spectrometers and tuneable lasers, covering a wide spectral range, catering for single element, array, sub-pixel resolution and photon counting devices. As well spectral responsivity, detector spatial uniformity and linearity measurements are available. The UK spectrometric scales are maintained from 200 nm to 56 μm and include regular, hemispherical and angular reflectance and transmittance scales, and artefacts for the wavenumber and ordinate calibration of mid-infrared spectrometers.

[1]  Frank J. J. Clarke,et al.  FTIR measurements—standards and accuracy , 2002 .

[2]  F. J. J. Clarke,et al.  Emissivity determined from hemispherical reflectance and transmittance throughout the thermal infrared spectrum , 1985 .

[3]  Michael Shaw,et al.  Diffuse reflectance scales at NPL , 2003, Other Conferences.

[4]  Frank J. J. Clarke.  The absolute calibration of mid-infrared transmittance standards , 1999 .

[5]  Nigel P. Fox,et al.  Establishing a new ultraviolet and near-infrared spectral responsivity scale , 1998 .

[6]  Nigel P. Fox,et al.  Comparison of the performance of infrared detectors for radiometric applications , 1996, Optics & Photonics.

[7]  Nigel P. Fox,et al.  Solid-state detectors for infrared radiometry , 1995 .

[8]  Leonard M. Hanssen,et al.  Testing the Radiometric Accuracy of FT-IR Transmittance Measurements , 1997 .

[9]  Frank J.J. Clarke.  Infrared regular reflectance standards from NPL , 1996, Optical Systems Design.

[10]  L. Hanssen,et al.  Integrating-sphere system and method for absolute measurement of transmittance, reflectance, and absorptance of specular samples. , 2001, Applied optics.

[11]  F.J.J. Clarke,et al.  Measurement of total reflectance, transmittance and emissivity over the thermal IR spectrum , 1985 .

[12]  Nigel P. Fox,et al.  High-accuracy, infrared, spectral responsivity scale , 1998 .

[13]  F. J. J. Clarke.  Measurement Of The Radiometric Properties Of Materials For Building And Aerospace Applications , 1980, Other Conferences.

[14]  N. Harrick,et al.  Determination of refractive index and film thickness from interference fringes. , 1971, Applied optics.

[15]  Leonard M. Hanssen,et al.  Infrared diffuse reflectance instrumentation and standards at NIST , 1999 .

[16]  F J.J Clarke,et al.  Improved Techniques For The NPL Hemispherical Reflectometer , 1988, Other Conferences.

[17]  L. Morren,et al.  A study of the reflection factor of usual photometric standards in the near infra-red , 1972 .

[18]  Nigel P. Fox,et al.  Reversible and apparent ageing effects in infrared detectors , 2003 .

[19]  Leonard M. Hanssen,et al.  Infrared regular reflectance and transmittance instrumentation and standards at NIST , 1999 .