Surface Decoration for Improving the Accuracy of Displacement Measurements by Digital Image Correlation in SEM
暂无分享,去创建一个
[1] B. Bhushan. Springer Handbook of Nanotechnology , 2017 .
[2] P. Withers,et al. Hole-Drilling Residual Stress Measurement with Artifact Correction Using Full-Field DIC , 2013 .
[3] P. Withers,et al. Micron-Scale Residual Stress Measurement by Micro-Hole Drilling and Digital Image Correlation , 2012 .
[4] P. Withers,et al. Mapping Residual Stress Distributions at the Micron Scale in Amorphous Materials , 2010 .
[5] P. Withers,et al. Mapping Residual Stress Profiles at the Micron Scale Using FIB Micro-Hole Drilling , 2010 .
[6] P. Liaw,et al. A study on the surface severe plastic deformation behavior of a Zr-based bulk metallic glass (BMG) , 2009 .
[7] H. Maier,et al. Monitoring the fatigue-induced damage evolution in ultrafine-grained interstitial-free steel utilizing digital image correlation , 2009 .
[8] Reynaldo Roque,et al. An optical strain measurement system for asphalt mixtures , 2009 .
[9] J. Laserna,et al. Focused ion beam imaging of laser ablation sub-surface effects on layered materials , 2008 .
[10] Patrik Hoffmann,et al. Gas-assisted focused electron beam and ion beam processing and fabrication , 2008 .
[11] H. Jin,et al. Micro-scale deformation measurement using the digital image correlation technique and scanning electron microscope imaging , 2008 .
[12] Sun Yaofeng,et al. Study of optimal subset size in digital image correlation of speckle pattern images , 2007 .
[13] C. Cané,et al. FIB-based technique for stress characterization on thin films for reliability purposes , 2007 .
[14] J. Giérak,et al. Focused Ion Beam Micro- and Nanoengineering , 2007 .
[15] Michael A. Sutton,et al. Scanning Electron Microscopy for Quantitative Small and Large Deformation Measurements Part I: SEM Imaging at Magnifications from 200 to 10,000 , 2007 .
[16] M. Sutton,et al. Scanning Electron Microscopy for Quantitative Small and Large Deformation Measurements Part II: Experimental Validation for Magnifications from 200 to 10,000 , 2007 .
[17] Michael A. Sutton,et al. Development of Patterns for Digital Image Correlation Measurements at Reduced Length Scales , 2007 .
[18] John Lambros,et al. Micro- and Nanoscale Deformation Measurement of Surface and Internal Planes via Digital Image Correlation , 2007 .
[19] Sven Bossuyt,et al. Quality assessment of speckle patterns for digital image correlation , 2006 .
[20] Carles Cané,et al. Digital image correlation of nanoscale deformation fields for local stress measurement in thin films , 2006 .
[21] J. Michler,et al. Local electron beam induced reduction and crystallization of amorphous titania films , 2006 .
[22] Carles Cané,et al. Measurement of residual stress by slot milling with focused ion-beam equipment , 2006 .
[23] W.Y. Kwong,et al. Electron-beam assisted platinum deposition as a protective layer for FIB and TEM applications , 2005, ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005..
[24] Stephen Pessiki,et al. Application of three-dimensional digital image correlation to the core-drilling method , 2005 .
[25] P. Withers,et al. Full‐field strain mapping by optical correlation of micrographs acquired during deformation , 2005, Journal of microscopy.
[26] M. Sutton,et al. Development of patterns for nanoscale strain measurements: I. Fabrication of imprinted Au webs for polymeric materials , 2004 .
[27] A. G. Evans,et al. A method for in situ measurement of the residual stress in thin films by using the focused ion beam , 2003 .
[28] P. Munroe,et al. Investigation of the structure of damage layers in TEM samples prepared using a focused ion beam , 2001 .
[29] Jed Lyons,et al. Measuring Microscopic Deformations with Digital Image Correlation , 1997 .
[30] J. S. Sirkis,et al. Displacement and strain measurement with automated grid methods , 1991 .
[31] M. Sutton,et al. Application Of Digital Correlation Methods To Rigid Body Mechanics , 1983 .
[32] W. Peters,et al. Digital Imaging Techniques In Experimental Stress Analysis , 1982 .
[33] Luke Bingleman,et al. Enhancing the robustness of ESPI measurements using digital image correlation , 2010 .
[34] Yuh J. Chao,et al. Advances in Two-Dimensional and Three-Dimensional Computer Vision , 2000 .