Engineering optical properties of metal/porous anodic alumina films for refractometric sensing
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Xiaohong Xu | Dengxin Ji | Qiaoqiang Gan | G. Ding | H. Zeng | James P. Parry | Lanfang Wang | X. Qin | Jinqiong Zhang | C. Deng | Guqiao Ding
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Xiaohong Xu | Dengxin Ji | Qiaoqiang Gan | G. Ding | H. Zeng | James P. Parry | Lanfang Wang | X. Qin | Jinqiong Zhang | C. Deng | Guqiao Ding