论文信息 - Synchrotron X-Ray Topography Analysis of Double Shockley Stacking Faults in 4H-SiC Wafers - 字舞流文

Synchrotron X-Ray Topography Analysis of Double Shockley Stacking Faults in 4H-SiC Wafers

G. Chung | M. Dudley | B. Raghothamachar | Jianqiu Guo | Yu Yang | D. Hansen | I. Manning | E. Sanchez | J. Quast | O. Goue