Selective Hardening: Toward Cost-Effective Error Tolerance

As ICs shrink into the nanometer range, they are increasingly subject to errors induced by physical faults. Traditional hardening for error mitigation consumes too much area and energy to be cost-effective in commercial applications. Selective hardening, applied only to a design's most error-sensitive parts, offers an attractive alternative. This article reviews recently proposed techniques to selectively harden nanoelectronics and achieve very low error levels.

[1]  Petru Eles,et al.  Analysis and optimization of fault-tolerant embedded systems with hardened processors , 2009, 2009 Design, Automation & Test in Europe Conference & Exhibition.

[2]  Bernd Becker,et al.  Low-Cost Hardening of Image Processing Applications Against Soft Errors , 2006, 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.

[3]  John P. Hayes,et al.  An Analysis Framework for Transient-Error Tolerance , 2007, 25th IEEE VLSI Test Symposium (VTS'07).

[4]  Bernd Becker,et al.  A study of cognitive resilience in a JPEG compressor , 2008, 2008 IEEE International Conference on Dependable Systems and Networks With FTCS and DCC (DSN).

[5]  Osnat Keren,et al.  Designing fault tolerant FSM by nano-PLA , 2009, 2009 15th IEEE International On-Line Testing Symposium.

[6]  Ahmad Patooghy,et al.  Low energy single event upset/single event transient-tolerant latch for deep subMicron technologies , 2009, IET Comput. Digit. Tech..

[7]  André K. Nieuwland,et al.  Combinational logic soft error analysis and protection , 2006, 12th IEEE International On-Line Testing Symposium (IOLTS'06).

[8]  Wenjing Rao,et al.  Selective Hardening of NanoPLA Circuits , 2008, 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems.

[9]  Wenchao Li,et al.  Verification-guided soft error resilience , 2007 .

[10]  Melvin A. Breuer,et al.  Multi-media applications and imprecise computation , 2005, 8th Euromicro Conference on Digital System Design (DSD'05).