Observation of single event burnout (SEB) in an SOI NLDMOSFET using a pulsed laser
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E. Zhang | Chaoming Liu | Bin Zhou | K. Galloway | Liang Wang | Yuanfu Zhao | M. Qiao | Xin Zhou | Xinjian Li | Tianqi Wang | Chunhua Qi | Lei Shu | Xin-Sheng Wang | Wei-Ping Chen | Yanqing Zhang | Rui-xin Shi | Weiyi Cao | Liang Ma