Spectroscopic light scattering from electrochromic tungsten‐oxide‐based films

Films of W oxide and oxyfluoride were made by reactive sputtering, and electrochromic absorption modulation was obtained by subsequent electrochemical Li intercalation. Total and diffuse transmittance and reflectance were measured in the 0.4–1 μm wavelength range using a newly developed instrument. The ratio between diffuse and total optical response was <0.2% for the transmittance and <1% for the reflectance irrespective of the electrochromic absorption level. These magnitudes of the scattering are acceptable for practical smart windows applications and lend credence to a description of electrochromism in terms of localized absorption centers. Vector perturbation theory for light scattering by a film with rough interfaces could be reconciled with the data, assuming uncorrelated roughness.

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