Planning Step-Stress Accelerated Life Tests With Two Experimental Variables

Methods, and guidelines are described for planning two-factor step-stress accelerated life test experiments for models in which there is no interaction between the factors.

[1]  W. Meeker A Comparison of Accelerated Life Test Plans for Weibull and Lognormal Distributions and Type I Censoring , 1984 .

[2]  Shie-Shien Yang,et al.  Optimal simple step-stress plan for cumulative exposure model using log-normal distribution , 2005, IEEE Transactions on Reliability.

[3]  W. Nelson,et al.  Optimum Simple Step-Stress Plans for Accelerated Life Testing , 1983, IEEE Transactions on Reliability.

[4]  J. Bert Keats,et al.  Statistical Methods for Reliability Data , 1999 .

[5]  K. Chaloner,et al.  Bayesian design for accelerated life testing , 1992 .

[6]  Herman Chernoff,et al.  Optimal Accelerated Life Designs for Estimation , 1962 .

[7]  W. B. Nelson,et al.  A bibliography of accelerated test plans , 2005, IEEE Transactions on Reliability.

[8]  William Q. Meeker,et al.  Optimum Accelerated Life Tests Wth a Nonconstant Scale Parameter , 1994 .

[9]  W. B. Nelson,et al.  A bibliography of accelerated test plans part II - references , 2005, IEEE Transactions on Reliability.

[10]  William Q. Meeker,et al.  Planning accelerated life tests with two or more experimental factors , 1995 .

[11]  Do Sun Bai,et al.  Optimal design of partially accelerated life tests for the exponential distribution under type-I censoring , 1992 .

[12]  Loon Ching Tang,et al.  Planning accelerated life tests for censored two‐parameter exponential distributions , 1999 .

[13]  William Q. Meeker,et al.  Optimum Accelerated Life-Tests for the Weibull and Extreme Value Distributions , 1975, IEEE Transactions on Reliability.

[14]  W. Nelson Statistical Methods for Reliability Data , 1998 .

[15]  D. Bai,et al.  Optimum simple step-stress accelerated life tests for Weibull distribution and type I censoring , 1993 .

[16]  G. Nahler,et al.  : Accelerated testing , 1999 .

[17]  Do Sun Bai,et al.  Optimum simple step-stress accelerated life tests with censoring , 1989 .