SOP package surface discoloration after PCT test
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[1] Underfill and mold compound influence on PoP aging under high current and high temperature stress , 2010, 3rd Electronics System Integration Technology Conference ESTC.
[2] Tzyy-Sheng Horng,et al. Electrical performance improvements on RFICs using bump chip carrier packages as compared to standard small outline packages , 2000, 2000 Proceedings. 50th Electronic Components and Technology Conference (Cat. No.00CH37070).
[3] A.C. Tan,et al. High temperature performance study of gold wire bonding on a palladium bonding pad , 2006, 2006 8th Electronics Packaging Technology Conference.
[4] W.H. Zhu,et al. Co-design for thermal performance and mechanical reliability of flip chip devices , 2010, 2010 11th International Conference on Electronic Packaging Technology & High Density Packaging.
[5] G. Hawkins,et al. Progression of damage caused by temperature cycling on a large die in a molded plastic package , 1990, 40th Conference Proceedings on Electronic Components and Technology.
[6] F. Shi,et al. Cu/Ag Leadframe-Finish Migration Phenomena in Stress-Induced Green Phosphorus Mold Epoxy: An Electrochemical and Material , 2005, Proceedings Electronic Components and Technology, 2005. ECTC '05..
[7] Peter Ramm,et al. 3D Integration technology: Status and application development , 2010, 2010 Proceedings of ESSCIRC.
[8] J. Lau,et al. Solder joint reliability of a thin small outline package (TSOP) , 1992, 1992 Proceedings 42nd Electronic Components & Technology Conference.
[9] Jun Wang,et al. Study on heat dissipation in Package-on-Package (POP) , 2010, 2010 11th International Conference on Electronic Packaging Technology & High Density Packaging.
[10] Mu-Chun Wang,et al. Influence of plastic assembly yield with molding technology , 2009, 2009 4th International Microsystems, Packaging, Assembly and Circuits Technology Conference.
[11] Investigation of thin small outline package (TSOP) solder joint crack after accelerated thermal cycling testing , 2009, 2009 International Conference on Electronic Packaging Technology & High Density Packaging.
[12] Peng Sun,et al. Development of a new Package-on-Package (PoP) structure for next-generation portable electronics , 2010, 2010 Proceedings 60th Electronic Components and Technology Conference (ECTC).
[13] T. Lin. Bottlenecks and strategies of green mold compounds , 2003 .
[14] John H. Lau,et al. Evolution and outlook of TSV and 3D IC/Si integration , 2010, 2010 12th Electronics Packaging Technology Conference.
[15] Molded underfill development for flipstack CSP , 2009, 2009 59th Electronic Components and Technology Conference.