Statistical evaluation of dynamic junction leakage current fluctuation using a simple arrayed capacitors circuit
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Tadahiro Ohmi | Rihito Kuroda | Shigetoshi Sugawa | Akinobu Teramoto | Shunichi Watabe | Takafumi Fujisawa | T. Ohmi | S. Sugawa | A. Teramoto | R. Kuroda | Kenichi Abe | Hiroyoshi Suzuki | K. Abe | S. Watabe | T. Fujisawa | Hiroyoshi Suzuki
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