Controlling Defect Formation of Nanoscale AlN: Toward Efficient Current Conduction of Ultrawide‐Bandgap Semiconductors
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Z. Mi | P. Bhattacharya | K. Sun | Yuanpeng Wu | E. Kioupakis | E. Ahmadi | A. Aiello | Xianhe Liu | M. Kira | Yi Sun | Ping Wang | A. Pandey | Z. Deng | D. Laleyan | C. Ahn