Modeling of pan coating processes: Prediction of tablet content uniformity and determination of critical process parameters.
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Wei Chen | William Early | San Kiang | Divyakant Desai | Shih-Ying Chang | Jennifer Wang | Olav Lyngberg | Alexander J. Marchut | Howard Stamato | Olav K. Lyngberg | Wei Chen | H. Stamato | William Early | A. Marchut | D. Desai | Jennifer J Wang | Alexander Marchut | Venkatramana Rao | S. Kiang | Shih-Ying Chang | V. Rao
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