Investigation on current density limits in power printed circuit boards
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D. Cottet | L. Coppola | D. Cottet | F. Wildner | F. Wildner | L. Coppola
[1] Yun Ling. On current carrying capacities of PCB traces , 2002, 52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345).
[2] J. Adam. New correlations between electrical current and temperature rise in PCB traces , 2004, Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545).
[3] Y. Shabany,et al. Component size and effective thermal conductivity of printed circuit boards , 2002, ITherm 2002. Eighth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (Cat. No.02CH37258).
[4] M.S.J. Hashmi,et al. Numerical prediction of electronic component heat transfer: an industry perspective , 2003, Ninteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium, 2003..
[5] K. Tu. Recent advances on electromigration in very-large-scale-integration of interconnects , 2003 .
[6] Baozhen Li,et al. Line depletion electromigration characterization of Cu interconnects , 2004 .
[7] Fred C. Lee,et al. Integrated EMI/thermal design for switching power supplies , 2000, 2000 IEEE 31st Annual Power Electronics Specialists Conference. Conference Proceedings (Cat. No.00CH37018).
[8] J. B. Wang. Reduction in conducted EMI noises of a switching power supply after thermal management design , 2003 .
[9] K. Tu. Recent advances on electromigration in very-large-scale-integration of interconnects , 2003 .
[10] Richard Ulrich,et al. Advanced electronic packaging , 2006 .
[11] Glenn R. Blackwell,et al. The electronic packaging handbook , 1999 .
[12] C.J.M. Lasance. The conceivable accuracy of experimental and numerical thermal analyses of electronic systems , 2001, Seventeenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (Cat. No.01CH37189).