Structural and morphological properties of perylene derivatives films on passivated semiconductor substrates

Molecules of 3,4,9,10-perylene-tetracarboxylic dianhydride (PTCDA) and N,N'-dimethyl 3,4,9,10-perylene-tetracarboxylic diimide (DiMe-PTCDI) were deposited by organic molecular beam deposition onto passivated Si(100) and GaAs(100) substrates in ultra high vacuum. Raman spectroscopy was employed to investigate in situ the influence of the substrate temperature during film growth on the structural properties and the morphology of organic films. Infrared spectroscopy was used to extract information on the molecular orientation. The results are complemented by those obtained from topographic imaging techniques, such as scanning electron microscopy (SEM) and atomic force microscopy (AFM) results.