论文信息 - Particle-induced mitigation of SEU sensitivity in high data rate GaAs HIGFET technologies

Particle-induced mitigation of SEU sensitivity in high data rate GaAs HIGFET technologies

Proton and heavy ion data on two GaAs HIGFET logic families, one source coupled (SCFL) and the other complementary (C-HIGFET), show the importance of dynamic testing and develop a new technique for mitigating SEU sensitivity by minimizing charge enhancement effects.

Cheryl J. Dale | P. W. Marshall | K. A. LaBel | T. R. Weatherford | M. La Macchia

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