[ ] thick films were prepared by tape casting method, using powder slurry in order to investigate dielectric properties i.e. dielectric constant, , Curie temperature, . Grain growth within thick films was observed with increasing weight ratio of . This observation can be explained by phenomena of substitution of ion for ion in the system. Also, the Curie temperature in thick films was shifted to lower temperature range with increasing . Furthermore, Curie temperature having maximum dielectric constant was in the range of , and hence sharper phase transformation occurred at Curie temperature. There occurred decrease in tunability and k-factor of calculated from the dielectric constant, above Curie temperature. In addition, above the , phase fixation was observed. This means that internal stress relief occurred with increasing domains.