Understanding the Electronic Transport of Al–Si and Al–Ge Nanojunctions by Exploiting Temperature-Dependent Bias Spectroscopy
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Corban G. E. Murphey | J. Cahoon | M. D. den Hertog | M. Sistani | R. Behrle | Sven Barth | W. M. Weber
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Corban G. E. Murphey | J. Cahoon | M. D. den Hertog | M. Sistani | R. Behrle | Sven Barth | W. M. Weber