Solderability, IMC evolution, and shear behavior of low-Ag Sn0.7Ag0.5Cu-BiNi/Cu solder joint

The solderability, intermetallic compounds (IMC) evolution, and shear behavior of the low-Ag Sn0.7Ag0.5Cu-3.5Bi-0.05Ni (SAC0705-BiNi)/Cu solder joint was investigated by comparing with Sn0.7Ag0.5Cu (SAC0705)/Cu and Sn3.0Ag0.5Cu (SAC305)/Cu solder joints. Experimental results demonstrated that the melting temperature of Sn0.7Ag0.5Cu-BiNi solder alloy was lower than that of SAC0705 and SAC305 solder. But the melting range of Sn0.7Ag0.5Cu-BiNi was wider. Compared with the other two kinds of alloys, SAC0705-BiNi showed the best wettability. SAC0705/Cu, SAC0705-BiNi/Cu, and SAC305 solder joints appeared similar IMC morphologies and grain size at the beginning of soldering, but evolved to different appearance as the soldering process proceeded. The growth rate of the IMC grains in SAC0705-BiNi/Cu solder joint was the lowest because of the refinement of Ni. SAC0705-BiNi/Cu solder joint showed the highest shear strength before and after being aged, mainly due to the enhancement of solid solution strengthening and dispersion strengthening of Bi and Ni in the bulk solder, as well as the refinement of Ni at the soldering interface.

[1]  Zbigniew Moser,et al.  Evaluation of the influence of Bi and Sb additions to Sn‐Ag‐Cu and Sn‐Zn alloys on their surface tension and wetting properties using analysis of variance – ANOVA , 2008 .

[2]  Bo-In Noh,et al.  Wettability and interfacial reactions of Sn–Ag–Cu/Cu and Sn–Ag–Ni/Cu solder joints , 2009 .

[3]  E. Gouda,et al.  Effect of zinc additions on structure and properties of Sn–Ag eutectic lead-free solder alloy , 2008 .

[4]  Y. T. Chin,et al.  Investigation of mechanical shock testing of lead-free SAC solder joints in fine pitch BGA package , 2008, Microelectron. Reliab..

[5]  Hiroshi Nishikawa,et al.  Microstructural and mechanical properties of Sn–Ag–Cu lead-free solders with minor addition of Ni and/or Co , 2008, Journal of Materials Science.

[6]  Feng Gao,et al.  Tensile properties and wettability of SAC0307 and SAC105 low Ag lead-free solder alloys , 2011 .

[7]  Paul S. Ho,et al.  Investigation of diffusion and electromigration parameters for Cu–Sn intermetallic compounds in Pb-free solders using simulated annealing , 2007 .

[8]  Pei Yao,et al.  Effects of multiple reflows on intermetallic morphology and shear strength of SnAgCu–xNi composite solder joints on electrolytic Ni/Au metallized substrate , 2008 .

[9]  Characteristic analysis of multi-layer piezoelectric substrate for SAW filters by effective surface permittivity method , 2010, 2010 5th International Microsystems Packaging Assembly and Circuits Technology Conference.

[10]  Henry Y. Lu,et al.  Solid-liquid reactions: The effect of Cu content on Sn-Ag-Cu interconnects , 2005 .

[11]  K. Puttlitz,et al.  Impact of the ROHS Directive on high-performance electronic systems , 2006 .

[12]  Johan Liu,et al.  Tensile properties and microstructural characterization of Sn–0.7Cu–0.4Co bulk solder alloy for electronics applications , 2008 .

[13]  K. S. Kim,et al.  Effects of fourth alloying additive on microstructures and tensile properties of Sn-Ag-Cu alloy and joints with Cu , 2003, Microelectron. Reliab..

[14]  I. Anderson Development of Sn–Ag–Cu and Sn–Ag–Cu–X alloys for Pb-free electronic solder applications , 2006 .

[15]  J. Pang,et al.  Nanoindentation on SnAgCu lead-free solder joints and analysis , 2006 .

[16]  Ning-Cheng Lee,et al.  The effects of additives to SnAgCu alloys on microstructure and drop impact reliability of solder joints , 2007 .

[17]  Kazuaki Ano,et al.  Kirkendall void formation in eutectic SnPb solder joints on bare Cu and its effect on joint reliability , 2005 .

[18]  Xiangrong Li,et al.  A deterministic mechanism for dendritic solidification kinetics , 2007 .

[19]  F. Sun,et al.  Improving Low-Ag Pb-Free Solder Performance by Adding Bi, Ni Elements , 2011 .

[20]  Michael Reid,et al.  A reliability model for SAC solder covering isothermal mechanical cycling and thermal cycling conditions , 2010, Microelectron. Reliab..