Edge effect enforced boundary element analysis of multilayered transmission lines

An improved boundary element method (BEM) for the calculation of the capacitance matrix in a multiconductor transmission line structure is presented, where the edge singularities of the charge and current near the corners of the cross-sections of the signal lines are embedded in the basis functions. The new method demonstrates improved accuracy and enhanced computational efficiency in comparison to previous methods. The results for the new algorithm are compared with those for other approaches presented in the literature. >

[1]  K. Huebner.  The finite element method for engineers , 1975 .

[2]  M. Lean.  Electromagnetic field solution with the boundary element method , 1981 .

[3]  E. Hammerstad,et al.  Accurate Models for Microstrip Computer-Aided Design , 1980, 1980 IEEE MTT-S International Microwave symposium Digest.

[4]  D. Pozar,et al.  Full-Wave Analysis of Microstrip Open-End and Gap Discontinuities , 1985 .

[5]  A. Konrad,et al.  New finite element techniques for skin effect problems , 1982 .

[6]  B. K. Gilbert,et al.  Packaging of GaAs signal processors on multichip modules , 1992 .

[7]  I. Fukai,et al.  Application of Boundary-Element Method to Electromagnetic Field Problems (Short Papers) , 1984 .

[8]  Barry K. Gilbert,et al.  Improved algorithmic methods for the prediction of wavefront propagation behavior in multiconductor transmission lines for high frequency digital signal processors , 1989, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[9]  C. Brebbia,et al.  Boundary Element Techniques , 1984 .

[10]  W. Delbare,et al.  Space-domain Green's function approach to the capacitance calculation of multiconductor lines in multilayered dielectrics with improved surface charge modeling , 1989 .

[11]  J. Kong,et al.  A hybrid method for the calculation of the resistance and inductance of transmission lines with arbitrary cross sections , 1991 .

[12]  W. H. Dierking,et al.  VLSI parasitic capacitance determination by flux tubes , 1982, IEEE Circuits & Systems Magazine.