ARCHIVAL LIFE EXPECTANCY OF 3M MAGNETO-OPTIC MEDIA

This work developed a model of life expectancies such that estimates could be made under a variety of temperatures and relative humidities. The model was such that a confidence interval could be established for any given amount of product compliance, at any temperature and relative humidity within a realistic storage range. A modified Eyring model was chosen to evaluate the growth kinetics of Byte Error Rates [bytes with errors + total bytes tested]. This model was then applied to a matrix of accelerated test data and fit to a variety of failure time distributions. The best fit was selected and estimates calculated at a variety of conditions. The confidence interval of these estimates were also made along with the percent of the population complying with these estimates.