Optimal burn-in for maximizing reliability of repairable non-series systems
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[1] Kyungmee O. Kim,et al. Two-level burn-in for reliability and economy in repairable series systems having incompatibility , 2004 .
[2] Sheldon M. Ross,et al. Stochastic Processes , 2018, Gauge Integral Structures for Stochastic Calculus and Quantum Electrodynamics.
[3] Richard E. Barlow,et al. Statistical Theory of Reliability and Life Testing: Probability Models , 1976 .
[4] Way Kuo,et al. Reliability, Yield, And Stress Burn-In , 1998 .
[5] Jie Mi. BURN-IN AND MAINTENANCE POLICIES , 2008 .
[6] E. A. Pohl,et al. Environmental stress screening strategies for multi-component systems with Weibull failure-times and imperfect failure detection , 1995, Annual Reliability and Maintainability Symposium 1995 Proceedings.
[7] Andrew K. S. Jardine,et al. An optimal burn‐in preventive‐replacement model associated with a mixture distribution , 2007, Qual. Reliab. Eng. Int..
[8] Patrick D.T. O'Connor,et al. Burn-In: an Engineering Approach to the Design and Analysis of Burn-In Procedures , 1983 .
[9] Shey-Huei Sheu,et al. Optimal burn-in time to minimize the cost for general repairable products sold under warranty , 2005, Eur. J. Oper. Res..
[10] Lawrence M. Leemis,et al. Component vs. system burn-in techniques for electronic equipment , 1989 .
[11] C. K. Hansen,et al. Heterogeneous part quality as a sourve of reliability improvement in repairable systems , 1991 .
[12] Kyung S. Park. Effect of Burn-In on Mean Residual Life , 1985, IEEE Transactions on Reliability.
[13] R. Yam,et al. Approaches for reliability modeling of continuous-state devices , 1999 .
[14] G. Bolton. Reliability , 2003, Medical Humanities.
[15] Way Kuo,et al. OPTIMAL BURN-IN SIMULATION ON HIGHLY INTEGRATED CIRCUIT SYSTEMS , 1992 .
[16] Z. A. Lomnicki. A note on the Weibull Renewal Process , 1966 .
[17] M. Verlaan,et al. Non-uniqueness in probabilistic numerical identification of bacteria , 1994, Journal of Applied Probability.
[18] Kyungmee O. Kim,et al. A general model of heterogeneous system lifetimes and conditions for system burn‐in , 2003 .
[19] J. Cozzolino. Probabilistic models of decreasing failure rate processes , 1968 .
[20] W. Kuo. Reliability Enhancement Through Optimal Burn-In , 1984, IEEE Transactions on Reliability.
[21] Dong Shang Chang. Optimal burn-in decision for products with an unimodal failure rate function , 2000, Eur. J. Oper. Res..
[22] L. Leemis,et al. Burn-In Models and Methods: A Review , 1990 .
[23] Kyungmee O. Kim,et al. Percentile Life and Reliability As Performance Measures in Optimal System Design , 2003 .
[24] Antoni Drapella,et al. Combining preventive replacement and burn‐in procedures , 2002 .
[25] Jie Mi,et al. Burn-in at the Component and System Level , 1996 .
[26] D. L. Dietrich,et al. A 2-level environmental-stress-screening (ESS) model: a mixed-distribution approach , 1994 .
[27] K. O. Kim,et al. Some considerations on system burn-in , 2005, IEEE Transactions on Reliability.
[28] J. Cha. Burn-in procedures for a generalized model , 2001, Journal of Applied Probability.
[29] J. Cha. On a better burn-in procedure , 2000, Journal of Applied Probability.
[30] E. Ziegel. Lifetime Data: Models in Reliability and Survival Analysis , 2010 .
[31] J. A. Nachlas,et al. Coordinated warranty and burn-in strategies , 1997 .