论文信息 - Millimeter wave measurements of temperature dependence of complex permittivity of dielectric plates by a cavity resonance method

Millimeter wave measurements of temperature dependence of complex permittivity of dielectric plates by a cavity resonance method

A novel circular cavity resonance method based on a rigorous analysis by the mode matching technique is proposed to measure the temperature dependences of complex permittivity of low loss dielectric plates accurately in the millimeter wave range 30-100 GHz. The measured results for GaAs substrates verify the usefulness.

Takashi Shimizu | Yoshio Kobayashi

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