论文信息 - Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolution

Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolution

We describe a new method for imaging magnetic fields with 1000 A resolution. The technique is based on using a force microscope to measure the magnetic force between a magnetized tip and the scanned surface. The method shows promise for the high‐resolution mapping of both static and dynamic magnetic fields.

Y. Martin | H. K. Wickramasinghe

[1] B. Argyle,et al. Magneto‐optic observation of Bloch lines , 1984 .

[2] R. Celotta,et al. Polarized Electron Probes of Magnetic Surfaces , 1986, Science.

[3] D. Rugar,et al. Lorentz microscopy of micron‐sized laser‐written magnetic domains in TbFe , 1986 .

[4] R. Shelby,et al. Magnetic domain imaging with a scanning Kerr effect microscope , 1986 .

[5] M. Kryder,et al. Magneto-optic determination of magnetic recording head fields , 1986 .

[6] Hemantha K. Wickramasinghe,et al. Atomic force microscope–force mapping and profiling on a sub 100‐Å scale , 1987 .